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    Determination of terrace size and edge roughness in vicinal Si{100} surfaces by surface-sensitive diffraction

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    Date
    1987
    Author
    Saloner, D.
    Martin, Joe Allen
    Tringides, Michael C.
    Savage, Donald E.
    Aumann, Christopher Eugene
    Lagally, Max G.
    Metadata
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    Permanent Link
    http://digital.library.wisc.edu/1793/9128
    Related Material/Data
    http://www.aip.org
    http://jap.aip.org
    DOI
    http://dx.doi.org/10.1063/1.337885
    Description
    This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
    Citation
    The following article appeared in Saloner, D., Martin, J.A., Tringides, M.C., Savage, D.E., Aumann, C.E., & Lagally, M.G. (1987). Determination Of Terrace Size And Edge Roughness In Vicinal Si{100} Surfaces By Surface Sensitive Diffraction. Journal Of Applied Physics, 61(8), 2884-93. and may be found at http://link.aip.org/link/?jap/61/2884
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    • College of Engineering Publications

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