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dc.contributor.authorLagally, Max G.en_US
dc.contributor.authorKariotis, Roberten_US
dc.date.accessioned2007-07-13T19:18:20Z
dc.date.available2007-07-13T19:18:20Z
dc.date.issued4en_US
dc.identifier.citationThe following article appeared in Lagally, M.G., & Kariotis, R. (4). Influence Of Beam Coherence On Measurements Of Roughness In Film Growth. Applied Physics Letters, 55(10), 960-2. and may be found at http://link.aip.org/link/?apl/55/960en_US
dc.identifier.urihttp://digital.library.wisc.edu/1793/9124
dc.descriptionThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.en_US
dc.format.extent444040 bytes
dc.format.mimetypeapplication/pdfen_US
dc.format.mimetypeapplication/pdf
dc.relation.ispartofhttp://www.aip.orgen_US
dc.relation.ispartofhttp://apl.aip.org/en_US
dc.rightsCopyright 4 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.en_US
dc.titleInfluence of beam coherence on measurements of roughness in film growthen_US
dc.identifier.doihttp://dx.doi.org/10.1063/1.101736en_US


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