Aluminum nanoscale order in amorphous Al92Sm8 measured by fluctuation electron microscopy
Stratton, William G.
Perepezko, John H.
Voyles, Paul M.
Khare, Sanjay V.
American Institute of Physics
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The following article appeared in Stratton, W.G., Hamann, J., Perepezko, J.H., Voyles, P.M., Mao, X., & Khare, S.V. (2005). Aluminum Nanoscale Order In Amorphous Al92 Sm8 Measured By Fluctuation Electron Microscopy. Applied Physics Letters, 86(14), -141910. and may be found at http://link.aip.org/link/?apl/86/