An X-ray spectromicroscopic study of electromigration in patterned Al(Cu) lines
Solak, Harun H.
American Institute of Physics
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The following article appeared in Solak, H.H., Lorusso, G.F.S.G.S., & Cerrina, F. (1999). An X Ray Spectromicroscopic Study Of Electromigration In Patterned Al(Cu) Lines. Applied Physics Letters, 74(1), 22-4. and may be found at http://link.aip.org/link/?apl/74/22