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dc.contributor.authorHuang, Yibingen_US
dc.contributor.authorCai, Xueyuen_US
dc.contributor.authorHolesinger, Terry G.en_US
dc.contributor.authorMaroni, Victor A.en_US
dc.contributor.authorYu, Dinganen_US
dc.contributor.authorParrella, Ronald D.en_US
dc.contributor.authorRupich, Martin W.en_US
dc.contributor.authorHellstrom, Eric E.en_US
dc.contributor.authorTeplitsky, Marken_US
dc.contributor.authorVenkataraman, Kartiken_US
dc.contributor.authorOtto, Alexanderen_US
dc.contributor.authorLarbalestier, David C.en_US
dc.date.accessioned2007-07-13T19:17:24Z
dc.date.available2007-07-13T19:17:24Z
dc.date.issued2003en_US
dc.identifier.citationHuang, Y.B., Cai, X.Y., Holesinger, T., Maroni, V.A., Yu, D., Parrella, R., et al. (2003). Improving The Critical Current Density In Bi 2223 Wires Via A Reduction Of The Secondary Phase Content. Ieee Transactions On Applied Superconductivity, 13(2), 3038-3041.en_US
dc.identifier.urihttp://digital.library.wisc.edu/1793/9000
dc.descriptionThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.en_US
dc.format.extent404898 bytes
dc.format.mimetypeapplication/pdfen_US
dc.format.mimetypeapplication/pdf
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCen_US
dc.relation.ispartofhttp://www.ieee.org/en_US
dc.relation.ispartofhttp://ieeexplore.ieee.org/servlet/opac?punumber=77en_US
dc.rightsCopyright 2003 Institute of Electrical and Electronics Engineersen_US
dc.rights©20xx IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.en_US
dc.titleImproving the critical current density in Bi-2223 wires via a reduction of the secondary phase contenten_US


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