Effect of the maximum processing temperature on the microstructure and electrical properties of melt processed Ag-sheathed Bi2Sr2CaCu2Ox tape

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Date
1997
Author
Polak, Milan
Zhang, Wei
Polyanskii, Anatoli
Pashitski, Alex E.
Hellstrom, Eric E.
Larbalestier, David C.
Publisher
IEEE, Piscataway, NJ, USA
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Permanent Link
http://digital.library.wisc.edu/1793/8988
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