Effect of the maximum processing temperature on the microstructure and electrical properties of melt processed Ag-sheathed Bi2Sr2CaCu2Ox tape
Pashitski, Alex E.
Hellstrom, Eric E.
Larbalestier, David C.
IEEE, Piscataway, NJ, USA
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Polak, M., Zhang, W., Polyanskii, A., Pashitski, A., Hellstrom, E.E., & Larbalestier, D.C. (1997). Effect of the maximum processing temperature on the microstructure and electrical properties of melt processed Ag-sheathed Bi2Sr2CaCu2Ox tape. In Proceedings of the 1996 Applied Superconductivity Conference. Part 2 (of 3), Aug 25-30 1996, 7 (2 pt 2), 1537-1540.