Critical current limiting factors in post annealed (Bi,Pb)2Sr2Ca2Cu3Ox tapes

File(s)
Date
2003Author
Jiang, Jianyi
Cai, Xueyu
Chandler, Jermal G.
Patnaik, Satyabrata
Polyanskii, Anatoli
Yuan, Yongwen
Hellstrom, Eric E.
Larbalestier, David C.
Publisher
Institute of Electrical and Electronics Engineers Inc
Metadata
Show full item recordPermanent Link
http://digital.library.wisc.edu/1793/8978Description
This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
Citation
Jiang, J., Cai, X.Y., Chandler, J.G., Patnaik, S., Polyanskii, A.A., Yuan, Y., et al. (2003). Critical current limiting factors in post annealed (Bi,Pb)2Sr2Ca2Cu3Ox tapes. In 2002 Applied Superconductivity Conference, Aug 4-9 2002, 13 (2 III), 3018-3021.