Thermally stable, oxidation resistant capping technology for Ti/Al ohmic contacts to n-GaN

File(s)

file_1.pdf (76.43Kb)

Date

2002

Author

Pelto, Christopher M.

Chang, Y. Austin

Chen, Yong

Williams, R. Stanley

Publisher

American Institute of Physics

Metadata

Show full item record

Permanent Link

http://digital.library.wisc.edu/1793/8944

Part of

College of Engineering Publications