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    Characterizing thermal runaway in HTS current leads

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    Date
    1999
    Author
    Pfotenhauer, John M.
    Lawrence, Jonathan W.
    Publisher
    IEEE, Piscataway, NJ, USA
    Metadata
    Show full item record
    Permanent Link
    http://digital.library.wisc.edu/1793/8910
    Related Material/Data
    http://www.ieee.org/
    http://ieeexplore.ieee.org/servlet/opac?punumber=77
    DOI
    http://dx.doi.org/10.1109/77.783325
    Description
    This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
    Citation
    Pfotenhauer, J.M., & Lawrence, J.W. (1999). Characterizing thermal runaway in HTS current leads. In Proceedings of the 1998 Applied Superconductivity Conference, ASC-98, Sep 13-Sep 18 1998, 9 (2 pt 1), 424-427.
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