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    Statistical estimation and testing for variation root-cause identification of multistage manufacturing processes

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    Date
    2004
    Author
    Zhou, Shiyu
    Chen, Yong
    Shi, Jianjun
    Publisher
    Institute of Electrical and Electronics Engineers Inc., Piscataway, United States
    Metadata
    Show full item record
    Permanent Link
    http://digital.library.wisc.edu/1793/8826
    Related Material/Data
    http://www.ieee.org/
    http://ieeexplore.ieee.org/servlet/opac?punumber=8856
    DOI
    http://dx.doi.org/10.1109/TASE.2004.829427
    Description
    This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
    Citation
    Zhou, S., Chen, Y., & Shi, J. (2004). Statistical Estimation And Testing For Variation Root Cause Identification Of Multistage Manufacturing Processes. Ieee Transactions On Automation Science And Engineering, 1(1), 73-83.
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    • College of Engineering Publications

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