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    • College of Engineering, University of Wisconsin--Madison
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    Statistical estimation and testing for variation root-cause identification of multistage manufacturing processes

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    file_1.pdf (1.191Mb)
    Date
    2004
    Author
    Zhou, Shiyu
    Chen, Yong
    Shi, Jianjun
    Publisher
    Institute of Electrical and Electronics Engineers Inc., Piscataway, United States
    Metadata
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    Permanent Link
    http://digital.library.wisc.edu/1793/8826
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    • College of Engineering Publications

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