Direct observation of interface roughness dependence of interfacial magnetism using diffuse X-ray resonant magnetic scattering

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Date
1997Author
MacKay, James F.
Teichert, Christian
Lagally, Max G.
Publisher
American Institute of Physics
Metadata
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http://digital.library.wisc.edu/1793/8780Description
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Citation
The following article appeared in MacKay, J.F., Teichert, C., & Lagally, M.G. (1997). Direct observation of interface roughness dependence of interfacial magnetism using diffuse X-ray resonant magnetic scattering. In 41st Annual Conference on Magnetism and Magnetic Materials, 12-15 Nov. 1996, 81 (8), 4353-. and may be found at http://link.aip.org/link/?jap/81/4353