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    Direct observation of interface roughness dependence of interfacial magnetism using diffuse X-ray resonant magnetic scattering

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    Date
    1997
    Author
    MacKay, James F.
    Teichert, Christian
    Lagally, Max G.
    Publisher
    American Institute of Physics
    Metadata
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    Permanent Link
    http://digital.library.wisc.edu/1793/8780
    Related Material/Data
    http://www.aip.org
    http://jap.aip.org
    Description
    This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
    Citation
    The following article appeared in MacKay, J.F., Teichert, C., & Lagally, M.G. (1997). Direct observation of interface roughness dependence of interfacial magnetism using diffuse X-ray resonant magnetic scattering. In 41st Annual Conference on Magnetism and Magnetic Materials, 12-15 Nov. 1996, 81 (8), 4353-. and may be found at http://link.aip.org/link/?jap/81/4353
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