Quantifying the thickness of magnetically active layers using x-ray resonant magnetic scattering
Barnes, Bryan M.
Savage, Donald E.
Lagally, Max G.
American Institute of Physics Inc., Melville, United States
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The following article appeared in Barnes, B.M., Li, Z., Savage, D.E., Wiedemann, E., & Lagally, M.G. (2004). Quantifying The Thickness Of Magnetically Active Layers Using X Ray Resonant Magnetic Scattering. Journal Of Applied Physics, 95(11 II), 6654-6656. and may be found at http://link.aip.org/link/?jap/95/6654