The role of contaminants in the variation of adhesion, friction, and electrical conduction properties of carbide-coated scanning probe tips and Pt(111) in ultrahigh vacuum

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Date
2004Author
Enachescu, Marius
Carpick, Robert W.
Ogletree, D. Frank
Salmeron, Miquel
Publisher
American Institute of Physics
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http://digital.library.wisc.edu/1793/8734Description
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Citation
The following article appeared in Enachescu, M., Carpick, R.W., Ogletree, D.F., & Salmeron, M. (2004). The Role Of Contaminants In The Variation Of Adhesion, Friction, And Electrical Conduction Properties Of Carbide Coated Scanning Probe Tips And Pt(111) In Ultrahigh Vacuum. Journal Of Applied Physics, 95(12), 7694-7700. and may be found at http://link.aip.org/link/?jap/95/7694