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dc.contributor.authorWang, Xuen_US
dc.contributor.authorHershkowitz, Noahen_US
dc.date.accessioned2007-07-13T19:14:57Z
dc.date.available2007-07-13T19:14:57Z
dc.date.issued2006en_US
dc.identifier.citationThe following article appeared in Wang, X., & Hershkowitz, N. (2006). Simple Way To Determine The Edge Of An Electron Free Sheath With An Emissive Probe. Review Of Scientific Instruments, 77(4), 43507-1. and may be found at http://link.aip.org/link/?rsi/77/43507en_US
dc.identifier.urihttp://digital.library.wisc.edu/1793/8682
dc.descriptionThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.en_US
dc.format.extent173241 bytes
dc.format.mimetypeapplication/pdfen_US
dc.format.mimetypeapplication/pdf
dc.publisherAmerican Institute of Physicsen_US
dc.relation.ispartofhttp://www.aip.orgen_US
dc.relation.ispartofhttp://rsi.aip.orgen_US
dc.rightsCopyright 2006 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.en_US
dc.titleSimple way to determine the edge of an electron-free sheath with an emissive probeen_US
dc.identifier.doihttp://dx.doi.org/10.1063/1.2195103en_US


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