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dc.contributor.authorOza, Ashish L.en_US
dc.contributor.authorMcCabe, Ronald P.en_US
dc.contributor.authorVanderby, Rayen_US
dc.contributor.authorLakes, Roderic S.en_US
dc.date.accessioned2007-07-13T19:14:45Z
dc.date.available2007-07-13T19:14:45Z
dc.date.issued2005en_US
dc.identifier.citationThe following article appeared in Oza, A. L., McCabe, R. P., Vanderby, R., & Lakes, R. S. (2005). Logarithmic Pulse Generator For Long Term Creep And Relaxation Testing. Review Of Scientific Instruments, 76(5), 056102-. and may be found at http://link.aip.org/link/?rsi/76/056102en_US
dc.identifier.urihttp://digital.library.wisc.edu/1793/8656
dc.descriptionThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.en_US
dc.format.extent46507 bytes
dc.format.mimetypeapplication/pdfen_US
dc.format.mimetypeapplication/pdf
dc.publisherAmerican Institute of Physics Inc., Melville, NY 11747-4502, United Statesen_US
dc.relation.ispartofhttp://www.aip.orgen_US
dc.relation.ispartofhttp://rsi.aip.orgen_US
dc.rightsCopyright 2005 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.en_US
dc.titleLogarithmic pulse generator for long-term creep and relaxation testingen_US
dc.identifier.doihttp://dx.doi.org/10.1063/1.1897667en_US


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