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    Characterization of the Interfacial Orientation and Molecular Conformation in a Glass-Forming Organic Semiconductor

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    Date
    2022-01-04
    Author
    Ferron, Thomas J.
    Thelen, Jacob L.
    Bagchi, Kushal
    Deng, Chuting
    Gann, Eliot
    de Pablo, Juan J.
    Ediger, M. D.
    Sunday, Daniel F.
    DeLongchamp, Dean M.
    Publisher
    ACS Applied Materials & Interfaces
    Metadata
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    Abstract
    The ability to control structure in molecular glasses has enabled them to play a key role in modern technology; in particular, they are ubiquitous in organic light-emitting diodes. While the interplay between bulk structure and optoelectronic properties has been extensively investigated, few studies have examined molecular orientation near buried interfaces despite its critical role in emergent functionality. Direct, quantitative measurements of buried molecular orientation are inherently challenging, and many methods are insensitive to orientation in amorphous soft matter or lack the necessary spatial resolution. To overcome these challenges, we use polarized resonant soft X-ray reflectivity (p-RSoXR) to measure nanometer-resolved, molecular orientation depth profiles of vapor-deposited thin films of an organic semiconductor Tris(4-carbazoyl-9-ylphenyl)amine (TCTA). Our depth profiling approach characterizes the vertical distribution of molecular orientation and reveals that molecules near the inorganic substrate and free surface have a different, nearly isotropic orientation compared to those of the anisotropic bulk. Comparison of p-RSoXR results with near-edge X-ray absorption fine structure spectroscopy and optical spectroscopies reveals that TCTA molecules away from the interfaces are predominantly planar, which may contribute to their attractive charge transport qualities. Buried interfaces are further investigated in a TCTA bilayer (each layer deposited under separate conditions resulting in different orientations) in which we find a narrow interface between orientationally distinct layers extending across ≈1 nm. Coupling this result with molecular dynamics simulations provides additional insight into the formation of interfacial structure. This study characterizes the local molecular orientation at various types of buried interfaces in vapor-deposited glasses and provides a foundation for future studies to develop critical structure–function relationships.
    Subject
    Amorphous materials
    Deposition
    Layers
    Molecules
    Optical properties
    organic semiconductor
    thin films
    buried interface
    NESAFS spectroscopy
    polarized resonant soft X-ray reflectivity
    coarse-grained simultations
    Permanent Link
    http://digital.library.wisc.edu/1793/84348
    Related Material/Data
    http://doi.org/10.1021/acsami.1c19948
    DOI
    10.1021/acsami.1c19948
    Type
    Journal Issue
    Citation
    ACS Appl. Mater. Interfaces 2022, 14, 2, 3455–3466
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    • Ediger Research Group

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