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    The influence of the starting Cu-Sn phase on the superconducting properties of subsequently reacted internal-Sn Nb3Sn conductors 

    Naus, Michael T.; Lee, Peter J.; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2001)
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    Transverse stress and fatigue effects in Y-Ba-Cu-O coated IBAD tapes 

    Ekin, Jack W.; Bray, Steven L.; Cheggour, Najib; Clickner, Cameron C.; Foltyn, Stephen R.; Arendt, Paul N.; Polyanskii, Anatoli; Larbalestier, David C.; McCowan, Christopher N. (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2001)
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    Magneto-optical imaging of transport currents in YBa2Cu3O7-x on RABiTS [trademark] 

    Feldmann, D. Matthew; Reeves, Jodi L.; Polyanskii, Anatoli; Goyal, Amit; Feenstra, Ron; Lee, Dominic F.; Paranthaman, M. Parans; Kroeger, Donald M.; Christen, David K.; Babcock, Susan E.; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2001)
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    Examination of current limiting mechanisms in monocore Bi2Sr2Ca2Cu3Ox tape with high critical current density 

    Polyanskii, Anatoli; Feldmann, D. Matthew; Patnaik, Satyabrata; Jiang, Jianyi; Cai, Xueyu; Larbalestier, David C.; DeMoranville, Kenneth L.; Yu, Dingan; Parrella, Ronald D. (Institute of Electrical and Electronics Engineers Inc, 2001)
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    Fast healing of deformation-induced damage in Ag/Bi-2223 tapes 

    Polyanskii, Anatoli; Beilin, Vladimir M.; Yashchin, Emmanuel; Goldgirsh, Alexander; Roth, Michael L.; Larbalestier, David C. (IEEE, 2001)
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    Overpressure processing Bi2223/Ag tapes 

    Rikel, Mark O.; Williams, Robert K.; Cai, Xueyu; Polyanskii, Anatoli; Jiang, Jianyi; Wesolowski, Denne; Hellstrom, Eric E.; Larbalestier, David C.; DeMoranville, Kenneth L.; Riley, Gilbert N., Jr. (IEEE, 2001)
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    Inter- and intragrain transport measurements in YBa2Cu3O7-x deformation textured coated conductors 

    Feldmann, D. Matthew; Larbalestier, David C.; Verebelyi, Darren T.; Zhang, Wei; Li, Qi; Riley, Gilbert N., Jr.; Feenstra, Ron; Goyal, Amit; Lee, Dominic F.; Paranthaman, M. Parans; Kroeger, Donald M.; Christen, David K. (American Institute of Physics, 2001)
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    Critical currents: Just how critical are they? 

    Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2001)
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    Current barriers in Y-Ba-Cu-O coated conductors 

    Reeves, Jodi L.; Feldmann, D. Matthew; Yang, Chau-Yun; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2001)
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    Electrodeposition process for the preparation of superconducting thallium oxide films 

    Bhattacharya, Raghu N.; Feldmann, D. Matthew; Larbalestier, David C.; Blaugher, Richard D. (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2001)
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    Larbalestier, David C. (12)
    Feldmann, D. Matthew (5)Polyanskii, Anatoli (5)Cai, Xueyu (3)Jiang, Jianyi (3)Riley, Gilbert N., Jr. (3)Christen, David K. (2)DeMoranville, Kenneth L. (2)Feenstra, Ron (2)Goyal, Amit (2)... View MoreDate Issued
    2001 (12)
    Has File(s)Yes (12)

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