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Critical current limiting factors in post annealed (Bi,Pb)2Sr2Ca2Cu3Ox tapes

Jiang, Jianyi; Cai, Xueyu; Chandler, Jermal G.; Patnaik, Satyabrata; Polyanskii, Anatoli; Yuan, Yongwen; Hellstrom, Eric E.; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2003)

Transverse stress and fatigue effects in Y-Ba-Cu-O coated IBAD tapes

Ekin, Jack W.; Bray, Steven L.; Cheggour, Najib; Clickner, Cameron C.; Foltyn, Stephen R.; Arendt, Paul N.; Polyanskii, Anatoli; Larbalestier, David C.; McCowan, Christopher N. (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2001)

Magneto-optical imaging of transport currents in YBa2Cu3O7-x on RABiTS [trademark]

Feldmann, D. Matthew; Reeves, Jodi L.; Polyanskii, Anatoli; Goyal, Amit; Feenstra, Ron; Lee, Dominic F.; Paranthaman, M. Parans; Kroeger, Donald M.; Christen, David K.; Babcock, Susan E.; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2001)

Examination of current limiting mechanisms in monocore Bi2Sr2Ca2Cu3Ox tape with high critical current density

Polyanskii, Anatoli; Feldmann, D. Matthew; Patnaik, Satyabrata; Jiang, Jianyi; Cai, Xueyu; Larbalestier, David C.; DeMoranville, Kenneth L.; Yu, Dingan; Parrella, Ronald D. (Institute of Electrical and Electronics Engineers Inc, 2001)

Local measurement of current density by magneto-optical current reconstruction in normally and overpressure processed Bi-2223 tapes

Patnaik, Satyabrata; Feldmann, D. Matthew; Polyanskii, Anatoli; Yuan, Yongwen; Jiang, Jianyi; Cai, Xueyu; Hellstrom, Eric E.; Larbalestier, David C.; Huang, Yibing (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2003)

Fast healing of deformation-induced damage in Ag/Bi-2223 tapes

Polyanskii, Anatoli; Beilin, Vladimir M.; Yashchin, Emmanuel; Goldgirsh, Alexander; Roth, Michael L.; Larbalestier, David C. (IEEE, 2001)

Overpressure processing Bi2223/Ag tapes

Rikel, Mark O.; Williams, Robert K.; Cai, Xueyu; Polyanskii, Anatoli; Jiang, Jianyi; Wesolowski, Denne; Hellstrom, Eric E.; Larbalestier, David C.; DeMoranville, Kenneth L.; Riley, Gilbert N., Jr. (IEEE, 2001)

Scanning laser imaging of dissipation in YBa2Cu 3O7-δcoated conductors

Abraimov, Dmytro V.; Feldmann, D. Matthew; Polyanskii, Anatoli; Gurevich, Alex; Daniels, George A.; Larbalestier, David C.; Zhuravel, Alexander P.; Ustinov, Alexey V. (American Institute of Physics Inc., Melville, NY 11747-4502, United States, 2004)

Microstructure and Jc improvements in overpressure processed Ag-sheathed Bi-2223 tapes

Yuan, Yongwen; Jiang, Jianyi; Cai, Xueyu; Patnaik, Satyabrata; Polyanskii, Anatoli; Hellstrom, Eric E.; Larbalestier, David C.; Williams, Robert K.; Huang, Yibing (Institute of Electrical and Electronics Engineers Inc, 2003)

Influence of nickel substrate grain structure on YBa2Cu3O7-x supercurrent connectivity in deformation-textured coated conductors

Feldmann, D. Matthew; Reeves, Jodi L.; Polyanskii, Anatoli; Kozlowski, Gregory; Biggers, Rand R.; Nekkanti, Robert M.; Maartense, Iman; Tomsic, Michael; Barnes, Paul N.; Oberly, Charles E.; Peterson, Timothy L.; Babcock, Susan E.; Larbalestier, David C. (American Institute of Physics, 2000)