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Critical current limiting factors in post annealed (Bi,Pb)2Sr2Ca2Cu3Ox tapes

Jiang, Jianyi; Cai, Xueyu; Chandler, Jermal G.; Patnaik, Satyabrata; Polyanskii, Anatoli; Yuan, Yongwen; Hellstrom, Eric E.; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2003)

Synthesis and properties of c-axis oriented epitaxial MgB2 thin films

Bu, Sang-Don; Kim, Dong Min; Choi, Junghoon; Giencke, Jonathan E.; Hellstrom, Eric E.; Larbalestier, David C.; Patnaik, Satyabrata; Cooley, Lance D.; Eom, Chang-Beom; Lettieri, James; Schlom, Darrell G.; Tian, Wei; Pan, Xiaoqing (American Institute of Physics, 2002)

Significant enhancement of irreversibility field in clean-limit bulk MgB2

Braccini, Valeria; Cooley, Lance D.; Patnaik, Satyabrata; Larbalestier, David C.; Manfrinetti, Pietro; Palenzona, Andrea; Siri, Antonio Sergio (American Institute of Physics Inc, 2002)

Examination of current limiting mechanisms in monocore Bi2Sr2Ca2Cu3Ox tape with high critical current density

Polyanskii, Anatoli; Feldmann, D. Matthew; Patnaik, Satyabrata; Jiang, Jianyi; Cai, Xueyu; Larbalestier, David C.; DeMoranville, Kenneth L.; Yu, Dingan; Parrella, Ronald D. (Institute of Electrical and Electronics Engineers Inc, 2001)

Local measurement of current density by magneto-optical current reconstruction in normally and overpressure processed Bi-2223 tapes

Patnaik, Satyabrata; Feldmann, D. Matthew; Polyanskii, Anatoli; Yuan, Yongwen; Jiang, Jianyi; Cai, Xueyu; Hellstrom, Eric E.; Larbalestier, David C.; Huang, Yibing (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2003)

Improved upper critical field in bulk-form magnesium diboride by mechanical alloying with carbon

Senkowicz, Benjamin J.; Giencke, Jonathan E.; Patnaik, Satyabrata; Eom, Chang-Beom; Hellstrom, Eric E.; Larbalestier, David C. (American Institute of Physics, 2005)

Microstructure and Jc improvements in overpressure processed Ag-sheathed Bi-2223 tapes

Yuan, Yongwen; Jiang, Jianyi; Cai, Xueyu; Patnaik, Satyabrata; Polyanskii, Anatoli; Hellstrom, Eric E.; Larbalestier, David C.; Williams, Robert K.; Huang, Yibing (Institute of Electrical and Electronics Engineers Inc, 2003)