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    Simulations of the effects of tin composition gradients on the superconducting properties of Nb3Sn conductors 

    Cooley, Lance D.; Fischer, Chad M.; Lee, Peter J.; Larbalestier, David C. (American Institute of Physics Inc., Melville, United States, 2004)
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    The influence of the starting Cu-Sn phase on the superconducting properties of subsequently reacted internal-Sn Nb3Sn conductors 

    Naus, Michael T.; Lee, Peter J.; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2001)
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    Interdiffusion of Cu and Sn in internal Sn Nb3Sn superconductors 

    Naus, Michael T.; Lee, Peter J.; Larbalestier, David C. (IEEE, Piscataway, NJ, USA, 2000)
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    Microchemical and microstructural comparison of high performance Nb3Al composites 

    Lee, Peter J.; Squitieri, Alexander A.; Larbalestier, David C.; Takeuchi, Takao; Banno, Nobuya; Fukuzaki, Tomokazu; Wada, Hitoshi (Institute of Electrical and Electronics Engineers Inc, 2003)
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    The microstructure and microchemistry of high critical current Nb3Sn strands manufactured by the bronze, internal-Sn and PIT techniques 

    Lee, Peter J.; Fischer, Chad M.; Naus, Michael T.; Squitieri, Alexander A.; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2003)
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    The upper critical field of filamentary Nb3Sn conductors 

    Gödeke, Arne; Jewell, Matthew C.; Fischer, Chad M.; Squitieri, Alexander A.; Lee, Peter J.; Larbalestier, David C. (American Institute of Physics, 2005)
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    Compositional and microstructural profiles across Nb3Sn filaments produced by different fabrication methods 

    Lee, Peter J.; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2001)
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    Measurement of the critical temperature transition and composition gradient in powder-in-tube Nb3Sn composite wire 

    Hawes, Christopher D.; Lee, Peter J.; Larbalestier, David C. (IEEE, Piscataway, NJ, USA, 2000)
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    Nb3Sn: Macrostructure, microstructure, and property comparisons for bronze and internal Sn process strands 

    Lee, Peter J.; Squitieri, Alexander A.; Larbalestier, David C. (IEEE, Piscataway, NJ, USA, 2000)

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    Author
    Larbalestier, David C. (9)
    Lee, Peter J. (9)
    Squitieri, Alexander A. (4)Fischer, Chad M. (3)Naus, Michael T. (3)Banno, Nobuya (1)Cooley, Lance D. (1)Fukuzaki, Tomokazu (1)Gödeke, Arne (1)Hawes, Christopher D. (1)... View MoreDate Issued2000 (3)2001 (2)2003 (2)2004 (1)2005 (1)Has File(s)Yes (9)

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