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Critical current limiting factors in post annealed (Bi,Pb)2Sr2Ca2Cu3Ox tapes

Jiang, Jianyi; Cai, Xueyu; Chandler, Jermal G.; Patnaik, Satyabrata; Polyanskii, Anatoli; Yuan, Yongwen; Hellstrom, Eric E.; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2003)

Synthesis and properties of c-axis oriented epitaxial MgB2 thin films

Bu, Sang-Don; Kim, Dong Min; Choi, Junghoon; Giencke, Jonathan E.; Hellstrom, Eric E.; Larbalestier, David C.; Patnaik, Satyabrata; Cooley, Lance D.; Eom, Chang-Beom; Lettieri, James; Schlom, Darrell G.; Tian, Wei; Pan, Xiaoqing (American Institute of Physics, 2002)

Local measurement of current density by magneto-optical current reconstruction in normally and overpressure processed Bi-2223 tapes

Patnaik, Satyabrata; Feldmann, D. Matthew; Polyanskii, Anatoli; Yuan, Yongwen; Jiang, Jianyi; Cai, Xueyu; Hellstrom, Eric E.; Larbalestier, David C.; Huang, Yibing (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2003)

Improved upper critical field in bulk-form magnesium diboride by mechanical alloying with carbon

Senkowicz, Benjamin J.; Giencke, Jonathan E.; Patnaik, Satyabrata; Eom, Chang-Beom; Hellstrom, Eric E.; Larbalestier, David C. (American Institute of Physics, 2005)

Improving the critical current density in Bi-2223 wires via a reduction of the secondary phase content

Huang, Yibing; Cai, Xueyu; Holesinger, Terry G.; Maroni, Victor A.; Yu, Dingan; Parrella, Ronald D.; Rupich, Martin W.; Hellstrom, Eric E.; Teplitsky, Mark; Venkataraman, Kartik; Otto, Alexander; Larbalestier, David C. (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2003)

Overpressure processing Bi2223/Ag tapes

Rikel, Mark O.; Williams, Robert K.; Cai, Xueyu; Polyanskii, Anatoli; Jiang, Jianyi; Wesolowski, Denne; Hellstrom, Eric E.; Larbalestier, David C.; DeMoranville, Kenneth L.; Riley, Gilbert N., Jr. (IEEE, 2001)

A shell model for the filament structure of Bi-2223 conductors

Holesinger, Terry G.; Kennison, Jack A.; Liao, Shaolin; Yuan, Yongwen; Jiang, Jianyi; Cai, Xueyu; Hellstrom, Eric E.; Larbalestier, David C.; Baurceanu, Ruxandra M.; Maroni, Victor A.; Huang, Yibing (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2005)

Evolution of core density of Ag-clad Bi-2223 tapes during process

Jiang, Jianyi; Cai, Xueyu; Chandler, Jermal G.; Rikel, Mark O.; Hellstrom, Eric E.; Parrella, Ronald D.; Yu, Dingan; Li, Qi; Rupich, Martin W.; Riley, Gilbert N., Jr.; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2001)

Significantly enhanced critical current density in Ag-sheathed (Bi,Pb) 2Sr2Ca2Cu3Ox composite conductors prepared by overpressure processing in final heat treatment

Yuan, Yongwen; Jiang, Jianyi; Cai, Xueyu; Larbalestier, David C.; Hellstrom, Eric E.; Huang, Yibing; Parrella, Ronald D. (American Institute of Physics Inc, 2004)

Microstructure and Jc improvements in overpressure processed Ag-sheathed Bi-2223 tapes

Yuan, Yongwen; Jiang, Jianyi; Cai, Xueyu; Patnaik, Satyabrata; Polyanskii, Anatoli; Hellstrom, Eric E.; Larbalestier, David C.; Williams, Robert K.; Huang, Yibing (Institute of Electrical and Electronics Engineers Inc, 2003)