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Critical current limiting factors in post annealed (Bi,Pb)2Sr2Ca2Cu3Ox tapes

Jiang, Jianyi; Cai, Xueyu; Chandler, Jermal G.; Patnaik, Satyabrata; Polyanskii, Anatoli; Yuan, Yongwen; Hellstrom, Eric E.; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2003)

Local measurement of current density by magneto-optical current reconstruction in normally and overpressure processed Bi-2223 tapes

Patnaik, Satyabrata; Feldmann, D. Matthew; Polyanskii, Anatoli; Yuan, Yongwen; Jiang, Jianyi; Cai, Xueyu; Hellstrom, Eric E.; Larbalestier, David C.; Huang, Yibing (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2003)

Improving the critical current density in Bi-2223 wires via a reduction of the secondary phase content

Huang, Yibing; Cai, Xueyu; Holesinger, Terry G.; Maroni, Victor A.; Yu, Dingan; Parrella, Ronald D.; Rupich, Martin W.; Hellstrom, Eric E.; Teplitsky, Mark; Venkataraman, Kartik; Otto, Alexander; Larbalestier, David C. (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2003)

Irreversibility fields of Bi-2223 at 30-77 K

Chandler, Jermal G.; Jiang, Jianyi; Cai, Xueyu; Schwartzkopf, Louis; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2003)

Characterization of individual filaments extracted from a Bi-2223/Ag tape

van der Meer, Olaf; Cai, Xueyu; Jiang, Jianyi; Parella, Ronald D.; Huang, Yibing; Larbalestier, David C.; ten Haken, Bennie; ten Kate, Herman H.J. (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2003)

Microstructure and Jc improvements in overpressure processed Ag-sheathed Bi-2223 tapes

Yuan, Yongwen; Jiang, Jianyi; Cai, Xueyu; Patnaik, Satyabrata; Polyanskii, Anatoli; Hellstrom, Eric E.; Larbalestier, David C.; Williams, Robert K.; Huang, Yibing (Institute of Electrical and Electronics Engineers Inc, 2003)