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Critical current limiting factors in post annealed (Bi,Pb)2Sr2Ca2Cu3Ox tapes

Jiang, Jianyi; Cai, Xueyu; Chandler, Jermal G.; Patnaik, Satyabrata; Polyanskii, Anatoli; Yuan, Yongwen; Hellstrom, Eric E.; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2003)

Irreversibility fields of Bi-2223 at 30-77 K

Chandler, Jermal G.; Jiang, Jianyi; Cai, Xueyu; Schwartzkopf, Louis; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2003)

Evolution of core density of Ag-clad Bi-2223 tapes during process

Jiang, Jianyi; Cai, Xueyu; Chandler, Jermal G.; Rikel, Mark O.; Hellstrom, Eric E.; Parrella, Ronald D.; Yu, Dingan; Li, Qi; Rupich, Martin W.; Riley, Gilbert N., Jr.; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2001)