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    Now showing items 11-20 of 41

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    Interdiffusion of Cu and Sn in internal Sn Nb3Sn superconductors 

    Naus, Michael T.; Lee, Peter J.; Larbalestier, David C. (IEEE, Piscataway, NJ, USA, 2000)
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    Microchemical and microstructural comparison of high performance Nb3Al composites 

    Lee, Peter J.; Squitieri, Alexander A.; Larbalestier, David C.; Takeuchi, Takao; Banno, Nobuya; Fukuzaki, Tomokazu; Wada, Hitoshi (Institute of Electrical and Electronics Engineers Inc, 2003)
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    Examination of current limiting mechanisms in monocore Bi2Sr2Ca2Cu3Ox tape with high critical current density 

    Polyanskii, Anatoli; Feldmann, D. Matthew; Patnaik, Satyabrata; Jiang, Jianyi; Cai, Xueyu; Larbalestier, David C.; DeMoranville, Kenneth L.; Yu, Dingan; Parrella, Ronald D. (Institute of Electrical and Electronics Engineers Inc, 2001)
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    Local measurement of current density by magneto-optical current reconstruction in normally and overpressure processed Bi-2223 tapes 

    Patnaik, Satyabrata; Feldmann, D. Matthew; Polyanskii, Anatoli; Yuan, Yongwen; Jiang, Jianyi; Cai, Xueyu; Hellstrom, Eric E.; Larbalestier, David C.; Huang, Yibing (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2003)
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    Improved upper critical field in bulk-form magnesium diboride by mechanical alloying with carbon 

    Senkowicz, Benjamin J.; Giencke, Jonathan E.; Patnaik, Satyabrata; Eom, Chang-Beom; Hellstrom, Eric E.; Larbalestier, David C. (American Institute of Physics, 2005)
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    Improving the critical current density in Bi-2223 wires via a reduction of the secondary phase content 

    Huang, Yibing; Cai, Xueyu; Holesinger, Terry G.; Maroni, Victor A.; Yu, Dingan; Parrella, Ronald D.; Rupich, Martin W.; Hellstrom, Eric E.; Teplitsky, Mark; Venkataraman, Kartik; Otto, Alexander; Larbalestier, David C. (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2003)
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    Nanoscale-SiC doping for enhancing Jc and Hc2 in superconducting MgB2 

    Dou, Shi Xue; Braccini, Valeria; Soltanian, Saied; Klie, Robert F.; Zhu, Yimei; Li, Shuang; Wang, Xiaolin; Larbalestier, David C. (American Institute of Physics, 2004)
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    Irreversibility fields of Bi-2223 at 30-77 K 

    Chandler, Jermal G.; Jiang, Jianyi; Cai, Xueyu; Schwartzkopf, Louis; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2003)
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    Fast healing of deformation-induced damage in Ag/Bi-2223 tapes 

    Polyanskii, Anatoli; Beilin, Vladimir M.; Yashchin, Emmanuel; Goldgirsh, Alexander; Roth, Michael L.; Larbalestier, David C. (IEEE, 2001)
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    Overpressure processing Bi2223/Ag tapes 

    Rikel, Mark O.; Williams, Robert K.; Cai, Xueyu; Polyanskii, Anatoli; Jiang, Jianyi; Wesolowski, Denne; Hellstrom, Eric E.; Larbalestier, David C.; DeMoranville, Kenneth L.; Riley, Gilbert N., Jr. (IEEE, 2001)
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    Larbalestier, David C. (41)
    Cai, Xueyu (11)Feldmann, D. Matthew (11)Polyanskii, Anatoli (11)Hellstrom, Eric E. (10)Jiang, Jianyi (10)Lee, Peter J. (9)Patnaik, Satyabrata (7)Huang, Yibing (6)Cooley, Lance D. (5)... View MoreDate Issued2001 (12)2003 (10)2000 (5)2004 (5)2005 (5)2002 (3)2006 (1)Has File(s)Yes (41)

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