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Imaging local dissipation and magnetic field in YBCO films with artificial defects

Abraimov, Dmytro V.; Feldmann, D. Matthew; Polyanskii, Anatoli; Gurevich, Alex; Liao, Shaolin; Daniels, George A.; Larbalestier, David C.; Zhuravel, Alexander P.; Ustinov, Alexey V. (Institute of Electrical and Electronics Engineers Inc., Piscataway, NJ 08855-1331, United States, 2005)

Through-thickness superconducting and normal-state transport properties revealed by thinning of thick film ex situ YBa2Cu3O 7-x coated conductors

Feldmann, D. Matthew; Larbalestier, David C.; Feenstra, Ron; Gapud, Albert A.; Budai, John D.; Holesinger, Terry G.; Arendt, Paul N. (American Institute of Physics Inc, 2003)

Scanning laser imaging of dissipation in YBa2Cu 3O7-δcoated conductors

Abraimov, Dmytro V.; Feldmann, D. Matthew; Polyanskii, Anatoli; Gurevich, Alex; Daniels, George A.; Larbalestier, David C.; Zhuravel, Alexander P.; Ustinov, Alexey V. (American Institute of Physics Inc., Melville, NY 11747-4502, United States, 2004)

Examination of current limiting mechanisms in monocore Bi2Sr2Ca2Cu3Ox tape with high critical current density

Polyanskii, Anatoli; Feldmann, D. Matthew; Patnaik, Satyabrata; Jiang, Jianyi; Cai, Xueyu; Larbalestier, David C.; DeMoranville, Kenneth L.; Yu, Dingan; Parrella, Ronald D. (Institute of Electrical and Electronics Engineers Inc, 2001)

Current barriers in Y-Ba-Cu-O coated conductors

Reeves, Jodi L.; Feldmann, D. Matthew; Yang, Chau-Yun; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2001)

Inter- and intragrain transport measurements in YBa2Cu3O7-x deformation textured coated conductors

Feldmann, D. Matthew; Larbalestier, David C.; Verebelyi, Darren T.; Zhang, Wei; Li, Qi; Riley, Gilbert N., Jr.; Feenstra, Ron; Goyal, Amit; Lee, Dominic F.; Paranthaman, M. Parans; Kroeger, Donald M.; Christen, David K. (American Institute of Physics, 2001)

Electrodeposition process for the preparation of superconducting thallium oxide films

Bhattacharya, Raghu N.; Feldmann, D. Matthew; Larbalestier, David C.; Blaugher, Richard D. (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2001)

Microstructural and magneto-optical characterization of high Jc BSCCO-2223/Ag tapes

Jiang, Jianyi; Shields, Trevor C.; Abell, J. Stuart; Polyanskii, Anatoli; Feldmann, D. Matthew; Larbalestier, David C. (IEEE, Piscataway, NJ, USA, 1999)

Influence of nickel substrate grain structure on YBa2Cu3O7-x supercurrent connectivity in deformation-textured coated conductors

Feldmann, D. Matthew; Reeves, Jodi L.; Polyanskii, Anatoli; Kozlowski, Gregory; Biggers, Rand R.; Nekkanti, Robert M.; Maartense, Iman; Tomsic, Michael; Barnes, Paul N.; Oberly, Charles E.; Peterson, Timothy L.; Babcock, Susan E.; Larbalestier, David C. (American Institute of Physics, 2000)

Local measurement of current density by magneto-optical current reconstruction in normally and overpressure processed Bi-2223 tapes

Patnaik, Satyabrata; Feldmann, D. Matthew; Polyanskii, Anatoli; Yuan, Yongwen; Jiang, Jianyi; Cai, Xueyu; Hellstrom, Eric E.; Larbalestier, David C.; Huang, Yibing (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2003)