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Multiple peaks in the angular and field dependence of the critical currents in Nb-47wt%Ti/Cu multilayers

Kadyrov, Ernest V.; Cooley, Lance D.; Gurevich, Alex; Lee, Peter J.; Larbalestier, David C. (IEEE, 1997)

The effect of anisotropic flux pinning microstructure on the sample length dependence of the magnetization critical current density in niobium-titanium superconductors

Bormio Nunes, C.; Heussner, Robert W.; Larbalestier, David C. (American Institute of Physics, 1996)

Through-thickness superconducting and normal-state transport properties revealed by thinning of thick film ex situ YBa2Cu3O 7-x coated conductors

Feldmann, D. Matthew; Larbalestier, David C.; Feenstra, Ron; Gapud, Albert A.; Budai, John D.; Holesinger, Terry G.; Arendt, Paul N. (American Institute of Physics Inc, 2003)

Study of the effect of the Sr/Ca ratio on the microstructure and critical current density of BSCCO 2212 Ag-sheathed tapes

Zhang, Wei; Pupysheva, Olga V.; Ma, Yonghui; Polak, Milan; Hellstrom, Eric E.; Larbalestier, David C. (IEEE, Piscataway, NJ, USA, 1997)

Superconducting materials for large scale applications

Scanlan, Ronald M.; Malozemoff, Alexis P.; Larbalestier, David C. (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2004)

Simulations of the effects of tin composition gradients on the superconducting properties of Nb3Sn conductors

Cooley, Lance D.; Fischer, Chad M.; Lee, Peter J.; Larbalestier, David C. (American Institute of Physics Inc., Melville, United States, 2004)

Improving flux pinning at high fields in intermetallic superconductors: Clues from MgB2 and MgCNi3

Cooley, Lance D.; Song, Xueyan; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2003)

Dependence of critical current density on microstructure in the SnMo6S8 Chevrel phase superconductor

Bonney, Laura A.; Willis, Tomas C.; Larbalestier, David C. (1995)

Critical current limiting factors in post annealed (Bi,Pb)2Sr2Ca2Cu3Ox tapes

Jiang, Jianyi; Cai, Xueyu; Chandler, Jermal G.; Patnaik, Satyabrata; Polyanskii, Anatoli; Yuan, Yongwen; Hellstrom, Eric E.; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2003)

Cold work loss during heat treatment and extrusion of Nb-46.5Wt%Ti composites as measured by microhardness

Parrell, Jeffrey A.; Lee, Peter J.; Larbalestier, David C. (1993)

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