• Login
    View Item 
    •   MINDS@UW Home
    • MINDS@UW Madison
    • College of Letters and Science, University of Wisconsin–Madison
    • Department of Chemistry
    • Ediger Research Group
    • View Item
    •   MINDS@UW Home
    • MINDS@UW Madison
    • College of Letters and Science, University of Wisconsin–Madison
    • Department of Chemistry
    • Ediger Research Group
    • View Item
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    Surface equilibration mechanism controls the molecular packing of glassy molecular semiconductors at organic interfaces

    Thumbnail
    File(s)
    Figure 1 of the main text (784.3Kb)
    Figure 2 of the main text (1.154Mb)
    Figure 3 of the main text (482.9Kb)
    Figure 4 of the main text (656.8Kb)
    Figure 5 of the main text (706.8Kb)
    Bilayer (Tsub = 290 K) GIWAXS pattern (18.00Mb)
    Bilayer (Tsub = 333 K) GIWAXS pattern (18.00Mb)
    Bilayer (Tsub = 343 K) GIWAXS pattern (18.00Mb)
    10 nm superlattice (Tsub = 290 K) GIWAXS pattern (18.00Mb)
    10 nm superlattice (Tsub = 333 K) GIWAXS pattern (18.00Mb)
    10 nm superlattice (Tsub = 343 K) GIWAXS pattern (18.00Mb)
    10 nm regular superlattice (Tsub = 290 K) GIWAXS pattern (18.00Mb)
    10 nm regular superlattice (Tsub = 343 K) GIWAXS pattern (18.00Mb)
    5 nm superlattice (Tsub = 290 K) GIWAXS pattern (18.00Mb)
    10 nm regular superlattice (Tsub = 333 K) GIWAXS pattern (18.00Mb)
    10 nm superlattice (Tsub = 343 K) GIWAXS pattern (18.00Mb)
    10 nm superlattice (Tsub = 290 K) GIWAXS pattern (18.00Mb)
    10 nm superlattice (Tsub = 333 K) GIWAXS pattern (18.00Mb)
    Ellipsometry data of co-deposited Alq3:DSA-Ph (Tsub = 343 K) (446.6Kb)
    Ellipsometry data of co-deposited Alq3:DSA-Ph (Tsub = 333 K) (446.6Kb)
    Ellipsometry data of co-deposited Alq3:DSA-Ph (Tsub = 290 K) (446.6Kb)
    5 nm superlattice (Tsub = 290 K) GIWAXS pattern (18.00Mb)
    Co-deposited Alq3:DSA-Ph (Tsub = 343 K) GIWAXS data (18.00Mb)
    Co-deposited Alq3:DSA-Ph (Tsub = 333 K) GIWAXS data (18.00Mb)
    Co-deposited Alq3:DSA-Ph (Tsub = 290 K) GIWAXS data (18.00Mb)
    Ellipsometry data of bilayer (Tsub = 290 K) (935.7Kb)
    Ellipsometry data of 10 nm superlattice (Tsub = 343 K) (891.2Kb)
    Ellipsometry data of 10 nm superlattice (Tsub = 333 K) (935.7Kb)
    Ellipsometry data of 10 nm superlattice (Tsub = 290 K) (935.7Kb)
    Ellipsometry data of 5 nm superlattice (Tsub = 290 K) (935.7Kb)
    Ellipsometry data of 10 nm regular superlattice (Tsub = 343 K) (891.2Kb)
    Ellipsometry data of 10 nm regular superlattice (Tsub = 333 K) (891.2Kb)
    Ellipsometry data of 10 nm regular superlattice (Tsub = 290 K) (935.7Kb)
    Ellipsometry data of 10 nm superlattice (Tsub = 343 K) (846.8Kb)
    Ellipsometry data of 10 nm superlattice (Tsub = 333 K) (891.2Kb)
    MF67old initial map.SE (935.7Kb)
    Ellipsometry data of 10 nm superlattice (Tsub = 290 K) (935.7Kb)
    XRR data 10 nm regular superlattice (Tsub = 290 K) (1.297Mb)
    XRR data 10 nm regular superlattice (Tsub = 333 K) (166.7Kb)
    XRR data 10 nm regular superlattice (Tsub = 343 K) (167.1Kb)
    Figure S1 (837.1Kb)
    Figure S2. 5 nm superlattice (466.0Kb)
    Figure S3a. 343 K XRR (689.7Kb)
    Figure S3b. XRR 333 K (689.7Kb)
    Figure S3c. XRR 290 K (654.3Kb)
    Figure S4a. 343 K (676.6Kb)
    Figure S4b. 333 K (683.7Kb)
    Figure S5. AFM of 5 nm superlattice (552.3Kb)
    Figure S6a. S_GIWAXS with mixtures (847.1Kb)
    Figure S6b. DSA-Ph birefringence w/ mixtures (682.7Kb)
    Figure S6c. Alq3 peak position w/ mixtures (850.3Kb)
    Figure S6d. Alq3 S_GIWAXS w/ mixtures (662.3Kb)
    Figure S7a. 343 K (911.5Kb)
    Figure S7b. 333 K (914.3Kb)
    Figure S7c. 290 K (887.5Kb)
    Figure S8. Kinetic stability of DSA-Ph in 10 superlattice (805.4Kb)
    AFM file of 5 nm superlattice (Tsub = 290 K) (3.077Mb)
    All plots and data included in the main text and the supporting information. (6.752Mb)
    Date
    2021
    Author
    Fiori, Marie E.
    Bagchi, Kushal
    Toney, Michael F.
    Ediger, M. D.
    Publisher
    United States National Academy of Sciences
    Metadata
    Show full item record
    Abstract
    Glasses prepared by physical vapor deposition (PVD) are anisotropic, and the average molecular orientation can be varied significantly by controlling the deposition conditions. While previous work has characterized the average structure of thick PVD glasses, most experiments are not sensitive to the structure near an underlying substrate or interface. Given the profound influence of the substrate on the growth of crystalline or liquid crystalline materials, an underlying substrate might be expected to substantially alter the structure of a PVD glass, and this near-interface structure is important for the function of organic electronic devices prepared by PVD, such as organic light emitting diodes (OLEDs). To study molecular packing near buried organic-organic interfaces, we prepare superlattice structures (stacks of 5 or 10 nm layers) of organic semiconductors, Alq3 (tris-(8-hydroxyquinoline)aluminum) and DSA-Ph (1,4-di-[4-(N,N-diphenyl)amino]styrylbenzene) using PVD. Superlattice structures significantly increase the fraction of the films near buried interfaces, thereby allowing for quantitative characterization of interfacial packing. Remarkably, both X-ray scattering and spectroscopic ellipsometry indicate that the substrate exerts a negligible influence on PVD glass structure. Thus, the surface equilibration mechanism previously advanced for thick films can successfully describe PVD glass structure even within the first monolayer of deposition on an organic substrate.
    Subject
    organic glass
    buried interfaces
    X-ray scattering
    physical vapor deposition
    Permanent Link
    http://digital.library.wisc.edu/1793/82341
    Type
    Article
    Part of
    • Ediger Research Group

    Contact Us | Send Feedback
     

     

    Browse

    All of MINDS@UWCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

    My Account

    Login

    Contact Us | Send Feedback