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dc.contributor.advisorMukherjee, Lopamudra
dc.contributor.advisorNguyen, Hien
dc.contributor.advisorGunawardena, Athula
dc.contributor.authorWoerishofer, Clint
dc.date.accessioned2021-07-08T19:02:36Z
dc.date.available2021-07-08T19:02:36Z
dc.date.issued2021-05
dc.identifier.urihttp://digital.library.wisc.edu/1793/82246
dc.descriptionThis file was last viewed in Adobe Acrobat Pro.en_US
dc.description.abstractMany domain specific machine learning tasks require more fine tuning with respect to nondecomposable metrics to be effective. In many applications such as medical diagnosis and fraud detection, traditional loss measures do not provide for the best performance. Optimizing for accuracy can give a false sense of effectiveness. In the case of Medical diagnosis, it is typical we want to minimize for false negatives. In the case of fraud detection, the data can often be imbalanced. In the case of imbalanced data, accuracy does not provide the best measure because the model may have high accuracy in the majority class while having low accuracy in the minority class causing the model to appear to have a high effectiveness on the data when in reality the bias of imbalanced data is skewing the results. For such cases, Non-Decomposable measures such a F-Score and AUC provide more detail into the real world performance of the model. Optimizing Non-Decomposable measures has posed a challenge in the past. In this paper, we will investigate using a proposed drag and drop linear programming layer for machine learning methods. We evaluate performance across multiple models and multiple data sets. Our results show increases in Non-Decomposable measures over traditional results and fast convergence.en_US
dc.language.isoen_USen_US
dc.publisherUniversity of Wisconsin - Whitewateren_US
dc.subjectNeural networks (Computer science)en_US
dc.subjectLinear programmingen_US
dc.subjectMachine learningen_US
dc.titleSolving non-decomposable objectives using linear programming layers in general machine learning models : SVMs and deep neural networksen_US
dc.typeThesisen_US


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