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dc.contributor.authorSchultz, Sam
dc.contributor.authorDylla, Maxwell
dc.contributor.authorSullivan, Nicholas
dc.contributor.authorJewell, Matthew C.
dc.date.accessioned2017-03-21T20:06:36Z
dc.date.available2017-03-21T20:06:36Z
dc.date.issued2017-03-21T20:06:36Z
dc.identifier.urihttp://digital.library.wisc.edu/1793/76192
dc.descriptionColor poster with text, models, images, and graphs.en
dc.description.abstractThe purpose of this study was to extract the tiny Nb3Sn filaments from their component wires for testing, and therefore be able to probe the intrinsic properties of Nb3Sn.en
dc.description.sponsorshipUniversity of Wisconsin--Eau Claire Office of Research and Sponsored Programs.en
dc.language.isoen_USen
dc.relation.ispartofseriesUSGZE AS589;
dc.subjectSuperconductorsen
dc.subjectElectronicsen
dc.subjectNb[3]Sn filamentsen
dc.subjectPostersen
dc.titleFracture Statistics of Individual Nb[3]Sn Filamentsen
dc.typePresentationen


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