Show simple item record

dc.contributor.advisorDunham, Doug J.
dc.contributor.authorSteinke, Kelsey
dc.contributor.authorKohl-Blomsness, Nokoma
dc.contributor.authorTollefson, Kyle
dc.date.accessioned2016-04-22T16:54:20Z
dc.date.available2016-04-22T16:54:20Z
dc.date.issued2015-04
dc.identifier.urihttp://digital.library.wisc.edu/1793/74818
dc.descriptionColor poster with text, photographs, images, and charts.en
dc.description.abstractThe purpose of this study was to the electrical properties of silicon carbide nanowires, specifically resistivity, as well as being able to control the resistivity of the wires to make electrical devices.en
dc.description.sponsorshipUniversity of Wisconsin--Eau Claire Office of Research and Sponsored Programsen
dc.language.isoen_USen
dc.relation.ispartofseriesUSGZE AS589en
dc.subjectSilicon carbideen
dc.subjectNanowiresen
dc.subjectPostersen
dc.title4-Point Resistivity Measurements of Silicon-Carbide Nanowiresen
dc.typePresentationen


Files in this item

Thumbnail
Thumbnail

This item appears in the following Collection(s)

  • Student Research Day
    Posters of collaborative student/faculty research presented at Student Research Day

Show simple item record