Browsing Theses--Materials Science and Engineering by Subject "oxide heterostructures, x-ray diffraction, nanoscale characterization"
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Nanoscale Structural Characterization of Oxide and Semiconductor Heterostructures
(2018-10-11)According to a recent report from International Technology Roadmap for Semiconductors (ITRS), semiconductor industry based on silicon Complementary metal–oxide–semiconductor (CMOS) technology is facing challenges in terms ...
