Now showing items 1-6 of 6
Structural disorder induced in hydrogenated amorphous silicon by light soaking
We show, using variable coherence transmission electron microscopy, that light soaking of amorphous hydrogenated silicon thin films leads to structural changes. We speculate that the structural changes are associated with ...
Structure and physical properties of paracrystalline atomistic models of amorphous silicon
We have examined the structure and physical properties of paracrystalline molecular dynamics models of amorphous silicon. Simulations from these models show qualitative agreement with the results of recent mesoscale ...
Evidence from atomistic simulations of fluctuation electron microscopy for preferred local orientations in amorphous silicon
Simulations from a family of atomistic structural models for unhydrogenated amorphous silicon suggest that fluctuation electron microscopy experiments have observed orientational order of paracrystalline grains in amorphous ...
Increasing medium-range order in amorphous silicon with low-energy ion bombardment
We have observed the existence of medium?range order in amorphous silicon with the fluctuation electron microscopy technique. We hypothesize that this structure is produced during the highly nonequilibrium deposition ...
Morphology and crystallization kinetics in HfO2 thin films grown by atomic layer deposition
We report the effects of annealing on the morphology and crystallization kinetics for the high-k gate dielectric replacement candidate hafnium oxide (HfO2). HfO2 films were grown by atomic layer deposition (ALD) on thermal ...
Nanoscale Structure and Relaxation in Zr50Cu45Al5 Bulk Metallic Glass
Hybrid reverse Monte Carlo simulations of the structure of Zr50Cu45Al5 bulk metallic glass incorporating medium-range structure from fluctuation electron microscopy data and short-range structure from an embedded atom ...