Measurement system analysis for process control at Company XYZ
| dc.contributor.advisor | Keyes, James | en_US |
| dc.contributor.author | Lau Mendez, How Y. | en_US |
| dc.date.accessioned | 2010-04-28T22:05:23Z | |
| dc.date.available | 2010-04-28T22:05:23Z | |
| dc.date.issued | 2006 | en_US |
| dc.identifier.uri | http://www.uwstout.edu/lib/thesis/2006/2006laumendezh.pdf | en_US |
| dc.identifier.uri | http://digital.library.wisc.edu/1793/42045 | |
| dc.description | Includes bibliographical references. | en_US |
| dc.subject.lcsh | Process control | en_US |
| dc.subject.lcsh | Lasers--Industrial applications | en_US |
| dc.title | Measurement system analysis for process control at Company XYZ | en_US |
| dc.type | Thesis | |
| thesis.degree.level | M.S. | en_US |
| thesis.degree.discipline | Technology Management Program | en_US |
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UW-Stout Masters Thesis Collection - Plan B
This collection holds UW-Stout Masters Theses within the Plan B format. A selection of theses cannot be published and must be requested from the archives. Contact archives@uwstout.edu for access.