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dc.contributor.advisorSorrell, Elberten_US
dc.contributor.authorKnutson, Brianen_US
dc.date.accessioned2010-04-28T21:42:48Z
dc.date.available2010-04-28T21:42:48Z
dc.date.issued2002en_US
dc.identifier.urihttp://digital.library.wisc.edu/1793/40511
dc.descriptionPlan Ben_US
dc.description.abstractThe semiconductor industry is facing challenges that involve the use of photoresist stripping solvents. This literature review compares the current solvents used, namely sulfuric acid and hydrogen peroxide and N-methylpyrrolidine, to an alternative supercritical carbon dioxide-based solvent. Currently used solvents have proven to be costly in terms of disposal, water usage and treatment, and replacement. These solvents have also been shown to have adverse affects on humans after short term and chronic exposures. The information gathered during this study shows that supercritical carbon dioxide-based solvents can reduce these costs immensely and may be a necessity for staying competitive in the future.
dc.publisherUniversity of Wisconsin--Stout
dc.subject.lcshSolventsen_US
dc.subject.lcshPhotoresistsen_US
dc.titleThe use of a supercritical carbon dioxide-based solvent as a cost effective and environmentally sound alternative to current photoresist stripping solventsen_US
dc.typeThesis
thesis.degree.levelM.S.en_US


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    This collection holds UW-Stout Masters Theses within the Plan B format. A selection of theses cannot be published and must be requested from the archives. Contact archives@uwstout.edu for access.

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