MINDS @ UW-Madison

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Aluminum nanoscale order in amorphous Al92Sm8 measured by fluctuation electron microscopy

Stratton, W. G.; Hamann, J.; Perepezko, J. H.; Voyles, P. M.; Mao, X.; Khare, S. V. (2005)
Donor behavior of Sb in ZnO

Liu, H. Y.; Izyumskaya, N.; Avrutin, V.; Ozgur, U.; Yankovich, A. B.; Kvit, A. V.; Voyles, P. M.; Morkoc, H. (2012)
Electric Field Response of Strained BiFeO3 and BaTiO3/CaTiO3 Superlattices

Cosgriff, Margaret P. (2015)
Electron scattering mechanisms in GZO films grown on a-sapphire substrates by plasma-enhanced molecular beam epitaxy

Liu, H. Y.; Avrutin, V.; Izyumskaya, N.; Ozgur, U.; Yankovich, A. B.; Kvit, A. V.; Voyles, P. M.; Morkoc, H. (2012)
Evaluation of connectivity, flux pinning, and upper critical field contributions to the critical current density of bulk pure and SiC-alloyed MgB2

Matsumoto, A.; Kumakura, H.; Kitaguchi, H.; Senkowicz, B. J.; Jewell, M. C.; Hellstrom, E. E.; Zhu, Y.; Voyles, P. M.; Larbalestier, D. C. (2006)
Evidence from atomistic simulations of fluctuation electron microscopy for preferred local orientations in amorphous silicon

Khare, S. V.; Nahkmanson, S. M.; Voyles, P. M.; Keblinski, P.; Abelson, J. R. (Aug 2004)
Expitaxial growth and magnetic propreties of Fe3O4 flims on TiN buffered Si(001), Si(110), and Si(111) substrates

Xiang, H.; Shi, F.; Rzchowski, M. S.; Voyles, P. M.; Chang, Y. A. (2010)
High-Jc MgB2 Josephson junctions with operating temperature up to 40 K

Chen, Ke; Zhuang, C. G.; Li, Q.; Zhu, Y.; Voyles, P. M.; Weng, X.; Redwing, J. M.; Singh, R. K.; Kleinsasser, A. W.; Xi, X. X. (2010)
Impurity distribution and microstructure of Ga-doped ZnO films grown by molecular beam epitaxy

Kvit, A. V.; Yankovich, A. B.; Avrutin, V.; Liu, H.; Izyumskaya, N.; Ozgur, U.; Morkoc, H.; Voyles, P. M. (2012)
Increasing medium-range order in amorphous silicon with low-energy ion bombardment

Gerbi, J. E.; Voyles, P. M.; Treacy, M. M. J.; Gibson, J. M.; Abelson, J. R. (2003)
Medium-range Order in Al-based Metallic Glasses

Yi, Feng (2011)
Medium Range Order in High Aluminum Content Amorphous Alloys Measured by Fluctuation Electron Microscopy

Stratton, William (2007)
Morphology and crystallization kinetics in HfO2 thin films grown by atomic layer deposition

Ho, M.-Y.; Gong, H.; Wilk, G. D.; Busch, B. W.; Green, M. L.; Voyles, P. M.; Muller, D. A.; Bude, M.; Lin, W. H.; See, A.; Loomans, M. E.; Lahiri, S. K.; Raisanen, Petri I. (Feb 2003)
Nanometer Scale Atomic Structure of Zirconium Based Bulk Metallic Glass

Hwang, Jinwoo (2011)
Nanoscale Structure and Relaxation in Zr50Cu45Al5 Bulk Metallic Glass

Voyles, P. M.; Stone, D. S.; Kramer, M. J.; Kalay, I.; Kalay, Y. E.; Melgarejo, Z. H.; Hwang, Jinwoo (May 11, 2012)
Nanosecond Structural Dynamics of Ferroelectric Oxide Thin Films

Chen, Pice (2013)
Quantitative Scanning Transmission Electron Microscopy of Electronic and Nanostructured Materials

Yankovich, Andrew (May 07, 2015)
Structural disorder induced in hydrogenated amorphous silicon by light soaking

Gibson, J. M.; Treacy, M. M. J.; Voyles, P. M.; Jin, H-C.; Abelson, J. R. (1998)
Structural, optical, and magnetic characterization of monodisperse Fe-doped ZnO nanocrystals

Parra-Palomino, A.; Perales-Perez, O.; Singhal, R.; Tomar, M.; Hwang, Jinwoo; Voyles, P. M. (2008)
Structure and physical properties of paracrystalline atomistic models of amorphous silicon

Voyles, P. M.; Zotov, N.; Nakhmanson, S. M.; Drabold, D. A.; Gibson, J. M.; Treacy, M. M. J.; Keblinski, P. (2001)

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