Quantification of pinning center thickness in conventionally processed and powder processed artificial pinning center microstructures
Lee, Peter J.
Larbalestier, David C.
Jablonski, Paul D.
IEEE, Piscataway, NJ, USA
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Lee, P. J., Larbalestier, D. C., & Jablonski, P. D. (1995). Quantification Of Pinning Center Thickness In Conventionally Processed And Powder Processed Artificial Pinning Center Microstructures. Ieee Transactions On Applied Superconductivity, 5(2 pt 2), 1701-1704.