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dc.contributor.authorBormio Nunes, C.en_US
dc.contributor.authorHeussner, Robert W.en_US
dc.contributor.authorLarbalestier, David C.en_US
dc.date.accessioned2007-07-13T19:34:53Z
dc.date.available2007-07-13T19:34:53Z
dc.date.issued1996en_US
dc.identifier.citationThe following article appeared in Bormio Nunes, C., Heussner, R.W., & Larbalestier, D.C. (1996). The Effect Of Anisotropic Flux Pinning Microstructure On The Sample Length Dependence Of The Magnetization Critical Current Density In Niobium Titanium Superconductors. Journal Of Applied Physics, 80(3), 1647-51. and may be found at http://link.aip.org/link/?jap/80/1647en_US
dc.identifier.urihttp://digital.library.wisc.edu/1793/11306
dc.descriptionThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.en_US
dc.format.extent119828 bytes
dc.format.mimetypeapplication/pdfen_US
dc.format.mimetypeapplication/pdf
dc.publisherAmerican Institute of Physicsen_US
dc.relation.ispartofhttp://www.aip.orgen_US
dc.relation.ispartofhttp://jap.aip.orgen_US
dc.rightsCopyright 1996 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.en_US
dc.titleThe effect of anisotropic flux pinning microstructure on the sample length dependence of the magnetization critical current density in niobium-titanium superconductorsen_US
dc.identifier.doihttp://dx.doi.org/10.1063/1.362963en_US


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