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Dependence of critical temperature and resistivity of thin film Nb47wt%Ti on magnetron sputtering conditions

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dc.contributor.author Hawes, Christopher D. en_US
dc.contributor.author Cooley, Lance D. en_US
dc.contributor.author Larbalestier, David C. en_US
dc.date.accessioned 2007-07-13T19:34:38Z
dc.date.available 2007-07-13T19:34:38Z
dc.date.issued 1999 en_US
dc.identifier.citation Hawes, C.D., Cooley, L.D., & Larbalestier, D.C. (1999). Dependence Of Critical Temperature And Resistivity Of Thin Film Nb47wt%Ti On Magnetron Sputtering Conditions. Ieee Transactions On Applied Superconductivity, 9(2 pt 2), 1712-1715. en_US
dc.identifier.uri http://digital.library.wisc.edu/1793/11274
dc.description This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. en_US
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dc.format.mimetype application/pdf en_US
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dc.publisher IEEE, Piscataway, NJ, USA en_US
dc.relation.ispartof http://www.ieee.org/ en_US
dc.relation.ispartof http://ieeexplore.ieee.org/servlet/opac?punumber=77 en_US
dc.rights Copyright 1999 Institute of Electrical and Electronics Engineers en_US
dc.rights ©20xx IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. en_US
dc.title Dependence of critical temperature and resistivity of thin film Nb47wt%Ti on magnetron sputtering conditions en_US
dc.identifier.doi http://dx.doi.org/10.1109/77.784783 en_US

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