Show simple item record

dc.contributor.authorMalik, Shamim M.en_US
dc.contributor.authorMuller, David Ericen_US
dc.contributor.authorSridharan, Kumaren_US
dc.contributor.authorFetherston, R. Paulen_US
dc.contributor.authorTran, Ngoc C.en_US
dc.contributor.authorConrad, John R.en_US
dc.date.accessioned2007-07-13T19:34:17Z
dc.date.available2007-07-13T19:34:17Z
dc.date.issued1995en_US
dc.identifier.citationThe following article appeared in Malik, S.M., Muller, D.E., Sridharan, K., Fetherston, R.P., Tran, N., & Conrad, J.R. (1995). Distribution Of Incident Ions And Retained Dose Analysis For A Wedge Shaped Target In Plasma Source Ion Implantation. Journal Of Applied Physics, 77(3), 1015-1019. and may be found at http://link.aip.org/link/?jap/77/1015en_US
dc.identifier.urihttp://digital.library.wisc.edu/1793/11230
dc.descriptionThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.en_US
dc.format.extent907687 bytes
dc.format.mimetypeapplication/pdfen_US
dc.format.mimetypeapplication/pdf
dc.publisherAmerican Institute of Physicsen_US
dc.relation.ispartofhttp://www.aip.orgen_US
dc.relation.ispartofhttp://jap.aip.orgen_US
dc.rightsCopyright 1995 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.en_US
dc.titleDistribution of Incident Ions and Retained Dose Analysis for a Wedge-Shaped Target in Plasma Source Ion-Implantationen_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record