Rapid profiling via stratified sampling

File(s)
Date
2001Author
Sastry, S. Subramanya
Bodik, Rastislav
Smith, James E.
Publisher
Institute of Electrical and Electronics Engineers Computer Society
Metadata
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http://digital.library.wisc.edu/1793/11182Related Material/Data
http://www.ieee.org/http://www.acm.org/pubs/contents/proceedings/series/isca/
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Citation
Sastry, S.S., Bodik, R., & Smith, J.E. (2001). Rapid profiling via stratified sampling. In 28th Annual Internattional Symposium on Computer Architecture (ISCA 2001), Jun 30-Jul 4 2001, , 278-289.