Inter- and intragrain transport measurements in YBa2Cu3O7-x deformation textured coated conductors
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Date
2001Author
Feldmann, D. Matthew
Larbalestier, David C.
Verebelyi, Darren T.
Zhang, Wei
Li, Qi
Riley, Gilbert N., Jr.
Feenstra, Ron
Goyal, Amit
Lee, Dominic F.
Paranthaman, M. Parans
Kroeger, Donald M.
Christen, David K.
Publisher
American Institute of Physics
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http://digital.library.wisc.edu/1793/11148Description
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Citation
The following article appeared in Feldmann, D.M., Larbalestier, D.C., Verebelyi, D.T., Zhang, W., Li, Q., Riley, G.N., et al. (2001). Inter And Intragrain Transport Measurements In Y Ba2 Cu3 O7 X Deformation Textured Coated Conductors. Applied Physics Letters, 79(24), 3998-4000. and may be found at http://link.aip.org/link/?apl/79/3998