Inter- and intragrain transport measurements in YBa2Cu3O7-x deformation textured coated conductors

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Author(s): Feldmann, D. Matthew; Larbalestier, David C.; Verebelyi, Darren T.; Zhang, Wei; Li, Qi; Riley, Gilbert N., Jr.; Feenstra, Ron; Goyal, Amit; Lee, Dominic F.; Paranthaman, M. Parans; Kroeger, Donald M.; Christen, David K.
Publisher: American Institute of Physics
Citation: The following article appeared in Feldmann, D.M., Larbalestier, D.C., Verebelyi, D.T., Zhang, W., Li, Q., Riley, G.N., et al. (2001). Inter And Intragrain Transport Measurements In Y Ba2 Cu3 O7 X Deformation Textured Coated Conductors. Applied Physics Letters, 79(24), 3998-4000. and may be found at http://link.aip.org/link/?apl/79/3998
Date: 2001
Part of: http://www.aip.org; http://apl.aip.org/
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Permanent link: http://digital.library.wisc.edu/1793/11148
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