Inter- and intragrain transport measurements in YBa2Cu3O7-x deformation textured coated conductors

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Date
2001
Author
Feldmann, D. Matthew
Larbalestier, David C.
Verebelyi, Darren T.
Zhang, Wei
Li, Qi
Riley, Gilbert N., Jr.
Feenstra, Ron
Goyal, Amit
Lee, Dominic F.
Paranthaman, M. Parans
Kroeger, Donald M.
Christen, David K.
Publisher
American Institute of Physics
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Permanent Link
http://digital.library.wisc.edu/1793/11148
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