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    Application of wavelet spectral analysis to plasma fluctuation measurements using beam emission spectroscopy

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    file_1.pdf (316.5Kb)
    Date
    1999
    Author
    Jakubowski, Marcin
    Fonck, Raymond J.
    Kim, Ji-Soo
    McKee, George R.
    Publisher
    American Institute of Physics Inc., Woodbury, NY, USA
    Metadata
    Show full item record
    Permanent Link
    http://digital.library.wisc.edu/1793/10518
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    • College of Engineering Publications

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