Application of wavelet spectral analysis to plasma fluctuation measurements using beam emission spectroscopy

File(s):

Author(s): Jakubowski, Marcin; Fonck, Raymond J.; Kim, Ji-Soo; McKee, George R.
Publisher: American Institute of Physics Inc., Woodbury, NY, USA
Citation: The following article appeared in Jakubowski, M., Fonck, R., Kim, J.S., & McKee, G. (1999). Application Of Wavelet Spectral Analysis To Plasma Fluctuation Measurements Using Beam Emission Spectroscopy. Review Of Scientific Instruments, 70(1 pt 2), 874-877. and may be found at http://link.aip.org/link/?rsi/70/874
Date: 1999
Part of: http://www.aip.org; http://rsi.aip.org
Description: This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
Permanent link: http://digital.library.wisc.edu/1793/10518
Export: Export to RefWorks