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dc.contributor.authorTritz, Kevin L.en_US
dc.contributor.authorFonck, Raymond J.en_US
dc.contributor.authorReinke, Matthewen_US
dc.contributor.authorWinz, Gregory R.en_US
dc.date.accessioned2007-07-13T19:28:45Z
dc.date.available2007-07-13T19:28:45Z
dc.date.issued2003en_US
dc.identifier.citationThe following article appeared in Tritz, K., Fonck, R., Reinke, M., & Winz, G. (2003). Tangential soft x-ray imaging for shape and current profile measurements. In Proceedings of the 14th Topical Conference on High - Temperature Plasma Diagnostics, Jul 8-11 2002, 74 (3 II), 2161-2164. and may be found at http://link.aip.org/link/?rsi/74/2161en_US
dc.identifier.urihttp://digital.library.wisc.edu/1793/10502
dc.descriptionThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.en_US
dc.format.extent248741 bytes
dc.format.mimetypeapplication/pdfen_US
dc.format.mimetypeapplication/pdf
dc.publisherAmerican Institute of Physics Incen_US
dc.relation.ispartofhttp://www.aip.orgen_US
dc.relation.ispartofhttp://rsi.aip.orgen_US
dc.rightsCopyright 2003 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.en_US
dc.titleTangential soft x-ray imaging for shape and current profile measurementsen_US
dc.identifier.doihttp://dx.doi.org/10.1063/1.1537876en_US


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