Tangential soft x-ray imaging for shape and current profile measurements
Tritz, Kevin L.
Fonck, Raymond J.
Winz, Gregory R.
American Institute of Physics Inc
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The following article appeared in Tritz, K., Fonck, R., Reinke, M., & Winz, G. (2003). Tangential soft x-ray imaging for shape and current profile measurements. In Proceedings of the 14th Topical Conference on High - Temperature Plasma Diagnostics, Jul 8-11 2002, 74 (3 II), 2161-2164. and may be found at http://link.aip.org/link/?rsi/74/2161