Enhanced sensitivity beam emission spectroscopy system for nonlinear turbulence measurements

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Date
2004
Author
Gupta, Deepak K.
Fonck, Raymond J.
McKee, George R.
Schlossberg, David J.
Shafer, Morgan W.
Publisher
American Institute of Physics Inc., Melville, NY 11747-4502, United States
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Permanent Link
http://digital.library.wisc.edu/1793/10492
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