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    Enhanced sensitivity beam emission spectroscopy system for nonlinear turbulence measurements

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    Date
    2004
    Author
    Gupta, Deepak K.
    Fonck, Raymond J.
    McKee, George R.
    Schlossberg, David J.
    Shafer, Morgan W.
    Publisher
    American Institute of Physics Inc., Melville, NY 11747-4502, United States
    Metadata
    Show full item record
    Permanent Link
    http://digital.library.wisc.edu/1793/10492
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    • College of Engineering Publications

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