Enhanced sensitivity beam emission spectroscopy system for nonlinear turbulence measurements
Gupta, Deepak K.
Fonck, Raymond J.
McKee, George R.
Schlossberg, David J.
Shafer, Morgan W.
American Institute of Physics Inc., Melville, NY 11747-4502, United States
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The following article appeared in Gupta, D. K., Fonck, R. J., McKee, G. R., Schlossberg, D. J., & Shafer, M. W. (2004). Enhanced Sensitivity Beam Emission Spectroscopy System For Nonlinear Turbulence Measurements. Review Of Scientific Instruments, 75(10 II), 3493-3495. and may be found at http://link.aip.org/link/?rsi/75/3493