Enhanced sensitivity beam emission spectroscopy system for nonlinear turbulence measurements

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Author(s): Gupta, Deepak K.; Fonck, Raymond J.; McKee, George R.; Schlossberg, David J.; Shafer, Morgan W.
Publisher: American Institute of Physics Inc., Melville, NY 11747-4502, United States
Citation: The following article appeared in Gupta, D. K., Fonck, R. J., McKee, G. R., Schlossberg, D. J., & Shafer, M. W. (2004). Enhanced Sensitivity Beam Emission Spectroscopy System For Nonlinear Turbulence Measurements. Review Of Scientific Instruments, 75(10 II), 3493-3495. and may be found at http://link.aip.org/link/?rsi/75/3493
Date: 2004
Part of: http://www.aip.org; http://rsi.aip.org
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Permanent link: http://digital.library.wisc.edu/1793/10492
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