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dc.contributor.authorPolyanskii, Anatolien_US
dc.contributor.authorFeldmann, D. Matthewen_US
dc.contributor.authorPatnaik, Satyabrataen_US
dc.contributor.authorJiang, Jianyien_US
dc.contributor.authorCai, Xueyuen_US
dc.contributor.authorLarbalestier, David C.en_US
dc.contributor.authorDeMoranville, Kenneth L.en_US
dc.contributor.authorYu, Dinganen_US
dc.contributor.authorParrella, Ronald D.en_US
dc.date.accessioned2007-07-13T19:28:14Z
dc.date.available2007-07-13T19:28:14Z
dc.date.issued2001en_US
dc.identifier.citationPolyanskii, A., Feldmann, D.M., Patnaik, S., Jiang, J., Cai, X., Larbalestier, D., et al. (2001). Examination of current limiting mechanisms in monocore Bi2Sr2Ca2Cu3Ox tape with high critical current density. In 2000 Applied Superconductivity Conference, Sep 17-22 2000, 11 (1 III), 3269-3272.en_US
dc.identifier.urihttp://digital.library.wisc.edu/1793/10434
dc.descriptionThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.en_US
dc.format.extent564809 bytes
dc.format.mimetypeapplication/pdfen_US
dc.format.mimetypeapplication/pdf
dc.publisherInstitute of Electrical and Electronics Engineers Incen_US
dc.relation.ispartofhttp://www.ieee.org/en_US
dc.relation.ispartofhttp://ieeexplore.ieee.org/servlet/opac?punumber=77en_US
dc.rightsCopyright 2001 Institute of Electrical and Electronics Engineersen_US
dc.rights©20xx IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.en_US
dc.titleExamination of current limiting mechanisms in monocore Bi2Sr2Ca2Cu3Ox tape with high critical current densityen_US
dc.identifier.doihttp://dx.doi.org/10.1109/77.919760en_US


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