Cantilever tilt compensation for variable-load atomic force microscopy
Cannara, Rachel J.
Brukman, Matthew J.
Carpick, Robert W.
American Institute of Physics
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The following article appeared in Cannara, R.J., Brukman, M.J., & Carpick, R.W. (2005). Cantilever Tilt Compensation For Variable Load Atomic Force Microscopy. Review Of Scientific Instruments, 76(5), -053706. and may be found at http://link.aip.org/link/?rsi/76/