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dc.contributor.authorCannara, Rachel J.en_US
dc.contributor.authorEglin, Michaelen_US
dc.contributor.authorCarpick, Robert W.en_US
dc.date.accessioned2007-07-13T19:25:14Z
dc.date.available2007-07-13T19:25:14Z
dc.date.issued2006en_US
dc.identifier.citationThe following article appeared in Cannara, R.J., Eglin, M., & Carpick, R.W. (2006). Lateral Force Calibration In Atomic Force Microscopy: A New Lateral Force Calibration Method And General Guidelines For Optimization. Review Of Scientific Instruments, 77(5), -053701. and may be found at http://link.aip.org/link/?rsi/77/en_US
dc.identifier.urihttp://digital.library.wisc.edu/1793/10038
dc.descriptionThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.en_US
dc.format.extent592398 bytes
dc.format.mimetypeapplication/pdfen_US
dc.format.mimetypeapplication/pdf
dc.publisherAmerican Institute of Physicsen_US
dc.relation.ispartofhttp://www.aip.orgen_US
dc.relation.ispartofhttp://rsi.aip.orgen_US
dc.rightsCopyright 2006 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.en_US
dc.titleLateral force calibration in atomic force microscopy: A new lateral force calibration method and general guidelines for optimizationen_US


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