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    • College of Engineering, University of Wisconsin--Madison
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    Lateral force calibration in atomic force microscopy: A new lateral force calibration method and general guidelines for optimization

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    file_1.pdf (578.5Kb)
    Date
    2006
    Author
    Cannara, Rachel J.
    Eglin, Michael
    Carpick, Robert W.
    Publisher
    American Institute of Physics
    Metadata
    Show full item record
    Permanent Link
    http://digital.library.wisc.edu/1793/10038
    Part of
    • College of Engineering Publications

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