Lateral force calibration in atomic force microscopy: A new lateral force calibration method and general guidelines for optimization

File(s)

file_1.pdf (578.5Kb)

Date

2006

Author

Cannara, Rachel J.

Eglin, Michael

Carpick, Robert W.

Publisher

American Institute of Physics

Metadata

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Permanent Link

http://digital.library.wisc.edu/1793/10038

Part of

• College of Engineering Publications