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Enhancement of the 77 K irreversibility field and critical current density of (Bi,Pb)2Sr2Ca2Cu3Ox tapes by manipulation of the final cooling rate

Parrell, Jeffrey A.; Larbalestier, David C.; Riley, Gilbert N., Jr.; Li, Qi; Parrella, Ronald D.; Teplitsky, Mark (American Inst of Physics, Woodbury, NY, USA; 1996)
Evolution of core density of Ag-clad Bi-2223 tapes during process

Jiang, Jianyi; Cai, Xueyu; Chandler, Jermal G.; Rikel, Mark O.; Hellstrom, Eric E.; Parrella, Ronald D.; Yu, Dingan; Li, Qi; Rupich, Martin W.; Riley, Gilbert N., Jr.; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc; 2001)
Inter- and intragrain transport measurements in YBa2Cu3O7-x deformation textured coated conductors

Feldmann, D. Matthew; Larbalestier, David C.; Verebelyi, Darren T.; Zhang, Wei; Li, Qi; Riley, Gilbert N., Jr.; Feenstra, Ron; Goyal, Amit; Lee, Dominic F.; Paranthaman, M. Parans; Kroeger, Donald M.; Christen, David K. (American Institute of Physics; 2001)
Overpressure processing Bi2223/Ag tapes

Rikel, Mark O.; Williams, Robert K.; Cai, Xueyu; Polyanskii, Anatoli; Jiang, Jianyi; Wesolowski, Denne; Hellstrom, Eric E.; Larbalestier, David C.; DeMoranville, Kenneth L.; Riley, Gilbert N., Jr. (IEEE; 2001)
Progress in superconducting performance of rolled multifilamentary Bi-2223 HTS composite conductors

Li, Qi; Riley, Gilbert N., Jr.; Parrella, Ronald D.; Fleshler, Steven; Rupich, Martin W.; Carter, William L.; Willis, Jeffrey O.; Coulter, J. Yates; Bingert, John F.; Sikka, Vinod K.; Parrell, Jeffrey A.; Larbalestier, David C. (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC; 1997)

Showing 1-5 of 5

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